Peter J. Cumpson : rechercher sur Z-Library

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1

Quartz crystal microbalance: A new design eliminates sensitivity outside the electrodes, often wrongly attributed to the electric fringing field

Cumpson, Peter J.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

1997

Langue:

english

Fichier:

PDF, 414 KB

english, 1997

2

Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance

Cumpson, Peter J., Hedley, John, Clifford, Charles A.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Année:

2005

Langue:

english

Fichier:

PDF, 552 KB

english, 2005

3

Accurate velocity measurements of AFM-cantilever vibrations by Doppler interferometry

Portolés, José F., Cumpson, Peter J., Hedley, John, Allen, Stephanie, Williams, Philip M., Tendler, Saul J.B.

Journal:

Journal of Experimental Nanoscience

Année:

2006

Langue:

english

Fichier:

PDF, 280 KB

english, 2006

4

Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device

Ratna Tantra, Dipak Gohil, Peter Cumpson

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 681 KB

english, 2009

5

The detection of airborne carbon nanotubes in relation to toxicology and workplace safety

Tantra, Ratna, Cumpson, Peter

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 197 KB

english, 2007

6

The Thickogram: a method for easy film thickness measurement in XPS

Peter J Cumpson

Journal:

Surface and Interface Analysis

Année:

2000

Langue:

english

Fichier:

PDF, 87 KB

english, 2000

7

Angle-resolved XPS depth-profiling strategies

Peter J Cumpson

Journal:

Applied Surface Science

Année:

1999

Langue:

english

Fichier:

PDF, 102 KB

english, 1999

8

Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function

Peter J. Cumpson

Journal:

Surface and Interface Analysis

Année:

1993

Langue:

english

Fichier:

PDF, 1.36 MB

english, 1993

9

Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments

Sano, Naoko, Cumpson, Peter J., Cwiertnia, Elke, Perry, Justin J., Singer, Brian W.

Journal:

Surface and Interface Analysis

Année:

2014

Langue:

english

Fichier:

PDF, 187 KB

english, 2014

10

Light scattering by fibers: An analysis using the partial wave phase-shift formalism of quantum mechanics

Cumpson, Peter J.

Journal:

American Journal of Physics

Année:

1990

Langue:

english

Fichier:

PDF, 653 KB

english, 1990

11

Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m

Cumpson, Peter J., Hedley, John, Clifford, Charles A., Chen, Xinyong, Allen, Stephanie

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

2004

Langue:

english

Fichier:

PDF, 402 KB

english, 2004

12

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Cumpson, Peter J., Portoles, Jose F., Barlow, Anders J., Sano, Naoko

Journal:

Journal of Applied Physics

Année:

2013

Langue:

english

Fichier:

PDF, 789 KB

english, 2013

13

Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards

Cumpson, Peter J.

Journal:

Johnson Matthey Technology Review

Année:

2014

Langue:

english

Fichier:

PDF, 206 KB

english, 2014

14

In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis

Wilson, Thomas A., Barlow, Anders J., Foster, Michael L., Bravo Sanchez, Mariela, Portoles, Jose F., Sano, Naoko, Cumpson, Peter J., Fletcher, Ian W.

Journal:

Surface and Interface Analysis

Année:

2016

Langue:

english

Fichier:

PDF, 1.66 MB

english, 2016

15

Multispectral optical imaging combined in situ with XPS or ToFSIMS and principal component analysis

Cumpson, Peter J., Fletcher, Ian W., Burnett, Richard, Sano, Naoko, Barlow, Anders J., Portoles, Jose F., Li, Lisa W., Kiang, Andrew Shih-Hsiung

Journal:

Surface and Interface Analysis

Année:

2016

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2016

16

Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis

Cumpson, Peter J, Fletcher, Ian W, Sano, Naoko, Barlow, Anders J

Journal:

Surface and Interface Analysis

Année:

2016

Langue:

english

Fichier:

PDF, 969 KB

english, 2016

17

Practical estimation of XPS binding energies using widely available quantum chemistry software

Tardio, Sabrina, Cumpson, Peter J.

Journal:

Surface and Interface Analysis

Année:

2017

Langue:

english

Fichier:

PDF, 407 KB

english, 2017

18

Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

Peter J. Cumpson

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Année:

1995

Langue:

english

Fichier:

PDF, 2.16 MB

english, 1995

19

Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs

Peter J. Cumpson, Peter Zhdan, John Hedley

Journal:

Ultramicroscopy

Année:

2004

Langue:

english

Fichier:

PDF, 394 KB

english, 2004

20

Preface

Colin Lea, Peter J. Cumpson

Journal:

Surface and Interface Analysis

Année:

2002

Langue:

english

Fichier:

PDF, 61 KB

english, 2002

21

Angle-resolved XPS characterization of urea formaldehyde–epoxy systems

Christian Perruchot, John F. Watts, Chris Lowe, Richard G. White, Peter J. Cumpson

Journal:

Surface and Interface Analysis

Année:

2002

Langue:

english

Fichier:

PDF, 265 KB

english, 2002

22

Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure–property relationships

Peter J. Cumpson

Journal:

Surface and Interface Analysis

Année:

2001

Langue:

english

Fichier:

PDF, 245 KB

english, 2001

23

Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

Cumpson, Peter J, Clifford, Charles A, Hedley, John

Journal:

Measurement Science and Technology

Année:

2004

Langue:

english

Fichier:

PDF, 490 KB

english, 2004

24

Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces

Cumpson, Peter, Sano, Naoko

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 633 KB

english, 2013

25

Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers

Cumpson, Peter J., Portoles, Jose F., Sano, Naoko

Journal:

Surface and Interface Analysis

Année:

2013

Langue:

english

Fichier:

PDF, 169 KB

english, 2013

26

Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon

Escobedo-Cousin, Enrique, Vassilevski, Konstantin, Hopf, Toby, Wright, Nick, O'Neill, Anthony, Horsfall, Alton, Goss, Jonathan, Cumpson, Peter

Journal:

Journal of Applied Physics

Année:

2013

Langue:

english

Fichier:

PDF, 1.84 MB

english, 2013

27

A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration

Portoles, Jose F, Cumpson, Peter J

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 1.46 MB

english, 2013

28

Oxygen reduction reaction by electrochemically reduced graphene oxide

Bikkarolla, Santosh Kumar, Cumpson, Peter, Joseph, Paul, Papakonstantinou, Pagona

Journal:

Faraday Discussions

Année:

2014

Langue:

english

Fichier:

PDF, 1.89 MB

english, 2014

29

A three-dimensional Mn 3 O 4 network supported on a nitrogenated graphene electrocatalyst for efficient oxygen reduction reaction in alkaline media

Bikkarolla, Santosh Kumar, Yu, Fengjiao, Zhou, Wuzong, Joseph, Paul, Cumpson, Peter, Papakonstantinou, Pagona

Journal:

Journal of Materials Chemistry A

Année:

2014

Langue:

english

Fichier:

PDF, 2.10 MB

english, 2014

30

Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications

Cumpson, Peter J., Portoles, Jose F., Barlow, Anders J., Sano, Naoko, Birch, Mark

Journal:

Surface and Interface Analysis

Année:

2013

Langue:

english

Fichier:

PDF, 666 KB

english, 2013

31

Observed damage during Argon gas cluster depth profiles of compound semiconductors

Barlow, Anders J., Portoles, Jose F., Cumpson, Peter J.

Journal:

Journal of Applied Physics

Année:

2014

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2014

32

Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers

Cumpson, Peter J., Portoles, Jose F., Sano, Naoko

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

2013

Langue:

english

Fichier:

PDF, 699 KB

english, 2013

33

A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology

Aitken, Robert J., Hankin, Steven M., Lang Tran, C., Donaldson, Kenneth, Stone, Vicki, Cumpson, Peter, Johnstone, James, Chaudhry, Qasim, Cash, Stephen, Garrod, John

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 106 KB

english, 2008

34

Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging

Barlow, Anders J., Scott, Oliver, Sano, Naoko, Cumpson, Peter J.

Journal:

Surface and Interface Analysis

Année:

2015

Langue:

english

Fichier:

PDF, 366 KB

english, 2015

35

Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms

Cumpson, Peter J, Portoles, Jose F, Sano, Naoko, Barlow, Anders J

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2013

36

Optimising the Growth of Few-Layer Graphene on Silicon Carbide by Nickel Silicidation

Escobedo-Cousin, Enrique, Vassilevski, Konstantin, Hopf, Toby, Wright, Nick, O’Neill, Anthony, Horsfall, Alton, Goss, Jonathan, Cumpson, Peter

Journal:

Materials Science Forum

Année:

2013

Langue:

english

Fichier:

PDF, 534 KB

english, 2013

37

Stability of reference masses: VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes

Cumpson, Peter J, Sano, Naoko, Barlow, Anders J, Portoles, Jose F

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 453 KB

english, 2013

38

Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration

Cumpson, Peter J, Hedley, John, Zhdan, Peter

Journal:

Année:

2003

Langue:

english

Fichier:

PDF, 353 KB

english, 2003

39

X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers

Cumpson, Peter J., Portoles, Jose F., Sano, Naoko, Barlow, Anders J.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Année:

2013

Langue:

english

Fichier:

PDF, 2.47 MB

english, 2013

40

Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

Cumpson, Peter J, Hedley, John

Journal:

Année:

2003

Langue:

english

Fichier:

PDF, 496 KB

english, 2003

41

Surface analysis characterisation of gum binders used in modern watercolour paints

Sano, Naoko, Cumpson, Peter J.

Journal:

Applied Surface Science

Année:

2016

Langue:

english

Fichier:

PDF, 2.01 MB

english, 2016

42

Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method

Cumpson, Peter J., Sano, Naoko, Fletcher, Ian W., Portoles, Jose F., Bravo-Sanchez, Mariela, Barlow, Anders J.

Journal:

Surface and Interface Analysis

Année:

2015

Langue:

english

Fichier:

PDF, 2.87 MB

english, 2015

43

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, CA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - Modelling of angle-resolved x-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterization of closely packed shell-core nanofibres

Wang, Jian, Cumpson, Peter J., Postek, Michael T., Allgair, John A.

Année:

2007

Langue:

english

Fichier:

PDF, 882 KB

english, 2007

44

Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface

Sano, Naoko, Barlow, Anders J., Tsakonas, Costas, Cranton, Wayne, Cumpson, Peter J.

Journal:

Surface and Interface Analysis

Année:

2016

Langue:

english

Fichier:

PDF, 665 KB

english, 2016

45

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Micro- and Nanometrology in Manufacturing Technology - An optical workstation for characterization and modification of MEMS

Hedley, John, Gorecki, Christophe, Asundi, Anand K., Burdess, Jim S., Harris, Alun J., Gallacher, Barry J., McNeil, Calum J., Cumpson, Peter J., Enderling, Stefan

Année:

2004

Langue:

english

Fichier:

PDF, 1.65 MB

english, 2004

46

Metrology at the nano scale

Sheridan, Ben, Cumpson, Peter, Bailey, Marc

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 415 KB

english, 2005

47

Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)

Barlow, Anders J., Popescu, Sinziana, Artyushkova, Kateryna, Scott, Oliver, Sano, Naoko, Hedley, John, Cumpson, Peter J.

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 2.51 MB

english, 2016

48

Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques

Barlow, Anders J., Portoles, Jose F., Sano, Naoko, Cumpson, Peter J.

Journal:

Microscopy and Microanalysis

Année:

2016

Langue:

english

Fichier:

PDF, 1.46 MB

english, 2016

49

Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs

Sano, Naoko, Purvis, Graham W. H., Barlow, Anders J., Abbott, Geoffrey D., Gray, Neil N. D., Cumpson, Peter J.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

2016

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2016

50

Decontamination of geological samples by gas cluster ion beam etching or ultra violet/ozone

Purvis, Graham, Gray, Neil, Sano, Naoko, Barlow, Anders, Cockell, Charles, Abbott, Geoffrey D., van der Land, Cees, Cumpson, Peter

Journal:

Chemical Geology

Année:

2017

Langue:

english

Fichier:

PDF, 458 KB

english, 2017